Institute of Materials Research and Engineering, A*STAR
All Sessions by A. Paterova
23 October
12:10
Infrared metrology with visible light
12:10 - 12:30
Anna Paterova, Hongzhi Yang, Chengwu An, Dmitry Kalashnikov and Leonid Krivitskiy Nonlinear interference of spontaneous parametric down-conversion photons (SPDC) has been studied over the last few decades. It is shown that due to the effect of induced coherence, the interference pattern for the signal SPDC photons is determined by idler SPDC photons too. Based on this concept, we demonstrate the method of IR metrology with visible light using a nonlinear Michelson interferometer. Current configuration of the interferometer allows multiple type of measurements, including IR spectroscopy, IR optical coherence tomography (OCT), IR imaging and IR polarimetry. The developed IR metrology technique is relevant to material research, optical inspection and quality control.
